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New Features of  Version 4.4

Ready for a new experience?

Shortened training & inference time

Fully Optimized for the
NVIDIA RTX 50 Series

With the release of the NVIDIA RTX 50 Series, we now provide optimized model support—bringing faster training, quicker inference, and enhanced AI performance with the latest hardware.

Users gain greater flexibility in building high-performance models across a wider range of hardware setups.

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Fast and precise,
now for a broader range of models

Advanced AI Labeling Tools

Now supporting a broader range of models, our upgraded AI labeling tool delivers faster inference and more precise labeling.

  • Expanded Model Support
    With just one click, the AI model automatically detects labeling areas, enabling faster and more precise labeling.

  • Size Threshold Adjustment Added
    Set size thresholds directly in the AI labeling tool to focus labeling on only the most relevant areas.

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Create custom OCR models
tailored to your project

OCR Text Rule

The OCR Text Rule allows users to detect only the

text that matches specified formats and conditions

within images.
It improves model performance and reliability by

correcting recurring errors, such as misdetecting the number '0' as the letter 'O,' even after the model

has been trained.

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Enhance inference speed
in multi-model environments

Enhanced Flowchart &
Inference Center

With this update, a single model can now be shared

across multiple classes, simplifying the structure of

multi-model workflow.
As the total number of required models is reduced,

the entire inspection flow becomes more streamlined,

resulting in faster real-time detection speeds.

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Precise analysis of small defects

New Measurement Tools

New measurement tools have been added to

support precise inspections of micro defects.

  • Path Distance Measurement
    Measure the length of various lines, particularly
    useful for assessing curved distances.

  • Detection Area Measurement
    Measure the size and area of detected regions
    for applications that require precise volume or
    area analysis.

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