Semiconductor vision inspection for minimized underkill and overkill
Semiconductor Vision Inspection Minimizing Underkill and Overkill
Neurocle’s vision inspection solution precisely detects even subtle defects in semiconductor processes, such as fine scratches, stains, and pattern abnormalities which are difficult to identify with the naked eye. This helps reduce overkill while reliably screening out true defects that could otherwise lead to underkill.
Neurocle's
solution clients
Neurocle's solution clients
Fields of application
Applications from wafer manufacturing to packaging
Wafer manufacturing
Ceramic component surface inspection
Wafer edge length measurement
Patterning
Pattern defect inspection
Wafer pattern surface inspection
Patterning
Pattern defect inspection
Wafer pattern surface inspection
Packaging
Chip pattern defect detection
Solder bump defect inspection
Between-chip scribe line inspection
Wafer surface secondary inspection
Packaging
Chip pattern defect detection
Solder bump defect inspection
Between-chip scribe line inspection
Wafer surface secondary inspection
Wafer manufacturing
Ceramic component surface inspection
Wafer edge length measurement
Patterning
Pattern defect inspection
Wafer pattern surface inspection
Packaging
Chip pattern defect detection
Solder bump defect inspection
Between-chip scribe line inspection
Wafer surface secondary inspection
Use case
Use cases in semiconductor manufacturing
Wafer manufacturing
Detects micron-scale defects at the earliest stages of the process, preventing defect propagation to downstream operations
Wafer manufacturing
Detects micron-scale defects at the earliest stages of the process, preventing defect propagation to downstream operations
Patterning
Precisely identifies micron-level defects arising in the early stages of the process, helping prevent defect propagation to downstream processes.
Patterning
Precisely identifies micron-level defects arising in the early stages of the process, helping prevent defect propagation to downstream processes.
Packaging
Accurately identify defects and microcracks using high-resolution imaging, improving yield while minimizing both overkill and underkill.
Packaging
Accurately identify defects and microcracks using high-resolution imaging, improving yield while minimizing both overkill and underkill.
Chip pattern defect detection
Determines pass/fail for semiconductor patterns and classifies defect types
Between-chip scribe line inspection
At the semiconductor chip-level inspection stage, inspections are carried out using specialized inspection equipment (AVI).
Solder bump defect inspection
Inspects solder bumps, the microscopic metal balls formed on the chip surface, using AOI inspection equipment.
Chip pattern defect detection
Determines pass/fail for semiconductor patterns and classifies defect types
Solder bump defect inspection
Inspects solder bumps, the microscopic metal balls formed on the chip surface, using AOI inspection equipment.
Between-chip scribe line inspection
At the semiconductor chip-level inspection stage, inspections are carried out using specialized inspection equipment (AVI).
Main features
Key advantages of Neurocle's semiconductor vision inspection
Accurate microdefect detection
Neurocle's deep learning technology accurately captures subtle differences between normal patterns and defects, detecting fine defects that traditional inspection methods easily overlook.
Accurate microdefect detection
Neurocle's deep learning technology accurately captures subtle differences between normal patterns and defects, detecting fine defects that traditional inspection methods easily overlook.
Accurate microdefect detection
Neurocle's deep learning technology accurately captures subtle differences between normal patterns and defects, detecting fine defects that traditional inspection methods easily overlook.
Precise detection even with high-resolution images
Build inspection models with original high-resolution images without resizing to detect defects without any information loss
Precise detection even with high-resolution images
Build inspection models with original high-resolution images without resizing to detect defects without any information loss
Precise detection even with high-resolution images
Build inspection models with original high-resolution images without resizing to detect defects without any information loss
Insights from Neurocle
Find out more about our latest news, technical insights and industry trends.
Insights from Neurocle
Find out more about our latest news, technical insights and industry trends.
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Insights from Neurocle
Find out more about our latest news, technical insights and industry trends.
Learn more about Neurocle's
Auto Deep Learning technology
Learn more about Neurocle's
Auto Deep Learning technology